1. IDDQ testing of VLSI circuits
پدیدآورنده : / edited by Ravi K. Gulati and Charles F. Hawkins
کتابخانه: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
موضوع : Integrated circuits - Very large scale integration - Testing,Metal oxide semiconductors, Complementary - Testing,Iddq testing
رده :
TK
7874
.
I3223
1993
